Archived posting to the Leica Users Group, 1999/01/11
[Author Prev] [Author Next] [Thread Prev] [Thread Next] [Author Index] [Topic Index] [Home] [Search]Alexey Merz alexey@webcom.com wrote: << ... AFM's are NOT "basically high resolution microscopes" as they can probe *many* properties of an object, including electical and mechanical properties. What's more, AFMs can be used (as I already pointed out) to manipulate, move, and place on substrates single molecules or even single atoms. They are not simply passive viewing devices, as you (parhaps not intentionally) imply. >> Not true. In addition to normal surface topography imaging, AFM may also be used to measure interatomic or intermolecular forces but it CANNOT be used to deposit materials or pattern surfaces on the atomic scale as you described. Such tasks, as demonstrated by IBM, require a scanning tunneling microscope (STM). I also want to point out that AFM may yield structural information on a sample but provides no clues about its electrical properties. Berg _________________________________________________________ DO YOU YAHOO!? Get your free @yahoo.com address at http://mail.yahoo.com